An Effective Test Generation Algorithm for Combinational Circuits

In this paper,an analysis of backtrack behavior in PODEM(the test generation algorithmfor combinational circuits presented by P.Goel)is given.It is pointed out that there are stillmany unnecessary backtracks in PODEM on some occasions.A new test generation algorithmnamed IPODEM is therefore proposed in this paper.IPODEM is an improvement over PODEMwith emphasis on backtrack of decision tree.A new backtrack approach is developed in thisalgorithm.It is shown that only O(j)of backtrack consumption is needed in...