A Built-in Test Pattern Generator

Built-in testing is currently of more concern due to the difficulties in testing a VLSI by using an external tester.In addition,Built-In Testing is also necessary for on-line testing and a fault-tolerant computing system.Using a Linear Feedback Shift Register(LFSR)as a built-in test pattern generator(BITPG)is a realistic and simple approach.An LFSR with maximum length can generate pseudo-random test patterns or all non-null vectors for exhaustive testing. This paper presents an LFSR design with non-maximum …