We use cookies to improve your experience with our site.
Shen Li. Testability Analysis at Switch Level for CMOS Circuits[J]. Journal of Computer Science and Technology, 1990, 5(2): 197-202.
Citation: Shen Li. Testability Analysis at Switch Level for CMOS Circuits[J]. Journal of Computer Science and Technology, 1990, 5(2): 197-202.

Testability Analysis at Switch Level for CMOS Circuits

  • In this paper we propose a controllability and observability measure at switch level for CMOS circuits based on the cost analysis approach.The complexity of the algorithm is nearly linear.
  • loading

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return