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Test Derivation Through Critical Path Transitions

Li Weidong; Wei Daozheng;   

  1. CAD Laboratory Institute of Computing Technology; Academia Sinica; Beijing; CAD Laboratory; Institute of Computing Technology;
  • Online:1992-01-10 Published:1992-01-10

In this paper,a new technique called test derivation is presented,aiming at the promotion of the random testing efficiency for combinational circuits.Combined with a fault simulator based on critical path tracing method,we introduce the concept of seed test derivation and attempt to generate a group of new tests from the seed test by means of critical path transition.The necessary conditions and effi- cient algorithms are proposed to guarantee the usefulness of the newly derived tests and the correctness of…

Key words: inheritance anomaly,concurrency,object-orientation,Petri net;

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[2] P.Goel, RAPS test pattern generator.IBM Technical Drsclusure Bulletin, 1978, 21(7),2787-2791.

[3] L.Shen and S.Y.H.Su, VLSI functional testing via critical path traces at a hardware description language level, Proc .2nd GI/NTG/GMR Conference on Fault-Folerant Computing System, Bonn, F.R.Germany, 1984, 364-379.

[4] Daozheng Wei, Parallel critical path tracing—A fault simulation algorithm for combinational circuits. J.Conput .Sci,Technnl, 1990, 5 (2),156-163,

[5] E.J.McCluskey, Logic Design Principle. Prentice-Hall, Englewood, New Jersey, 1986. ……….
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