Special Issue: Computer Architecture and Systems; Artificial Intelligence and Pattern Recognition

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A Neural Network Appraoch to Fault Diagnosis in Analog Circuits

Wei Naihong; Yang Shiyuan; Tong Shibai;   

  1. Department of Automation; Tsinghua University; Beijing 100084;
  • Online:1996-11-10 Published:1996-11-10

This paper presents a neural network based fault diagnosis approach for analog circuits, taking the tolerances of circuit elements into account. Specifi-cally, a normalization rule of input information, a pseudo-fault domain border (PFDB) pattern selection method and a new output error function are proposed for training the backpropagation (BP) network to be a fault diagnoser. Experi-mental results demonstrate that the diagnoser performs as well as or better than any classical approaches in terms of accurac…

Key words: higher-order process; labelled transition semantics; barbed bisimulation; context-bisimulation; WFMS; Task Agent; TaskActivator; multi-TaskDomain architecture;



[1] Liu.R.W. Testing and Diagnosis of Analog Circuits and Systems. Van Nostrand Reinhold, NewYork, 1991, pp. 1-35.

[2] Starzyk.J.A et al. Artificial neural networks for testing analog circuits. In Proc. of IEEE International Symposium. on Circuits and Systems, New Orleans, May 1-3, 1990, pp. 1851-1854.

[3] Haley.P.J et al. Extrapolation limitations of multilayer feedforward neural networks. In Proc.of IJCNN'92, Baltimore, Vo1.IV, pp. 25-30. ………..
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ISSN 1000-9000(Print)

         1860-4749(Online)
CN 11-2296/TP

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