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Volume 34 Issue 5
August  2019
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Jie Xiao, Zhan-Hui Shi, Jian-Hui Jiang, Xu-Hua Yang, Yu-Jiao Huang, Hai-Gen Hu. A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm[J]. Journal of Computer Science and Technology, 2019, 34(5): 1136-1151. DOI: 10.1007/s11390-019-1965-1
Citation: Jie Xiao, Zhan-Hui Shi, Jian-Hui Jiang, Xu-Hua Yang, Yu-Jiao Huang, Hai-Gen Hu. A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm[J]. Journal of Computer Science and Technology, 2019, 34(5): 1136-1151. DOI: 10.1007/s11390-019-1965-1
shu

A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm

  • 1 College of Computer Science and Technology, Zhejiang University of Technology, Hangzhou 310023, China;
    2 School of Software Engineering, Tongji University, Shanghai 201804, China

Funds: The work was supported by the National Natural Science Foundation of China under Grant Nos. 61972354, 61502422, 61432017, 61772199, 61773348, and 61503338, the Natural Science Foundation of Zhejiang Province of China under Grant Nos. LY18F020028, LY18F030023, LY18F030084, and LY17F030016, and the Innovative Experiment Project of Zhejiang University of Technology of China under Grant No. PX-68182112.
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  • Author Bio:

    Jie Xiao received his Ph.D. degree in computer system architecture from Tongji University, Shanghai, in 2013. He is currently working with the College of Computer Science and Technology, Zhejiang University of Technology, Hangzhou. His current research interests include reliability evaluation and fault-tolerant design, deep learning and combinatorial optimization-computation. He also serves as a consultant and technical adviser for a research institute in electronic information fields. He is a member of CCF.

  • Corresponding author:

    Jian-Hui Jiang E-mail: jhjiang@tongji.edu.cn

  • Received Date: January 10, 2019
  • Revised Date: June 02, 2019
  • Published Date: August 30, 2019
    Abstract
  • The reliability allowance of circuits tends to decrease with the increase of circuit integration and the application of new technology and materials, and the hardening strategy oriented toward gates is an effective technology for improving the circuit reliability of the current situations. Therefore, a parallel-structured genetic algorithm (GA), PGA, is proposed in this paper to locate reliability-critical gates to successfully perform targeted hardening. Firstly, we design a binary coding method for reliability-critical gates and build an ordered initial population consisting of dominant individuals to improve the quality of the initial population. Secondly, we construct an embedded parallel operation loop for directional crossover and directional mutation to compensate for the deficiency of the poor local search of the GA. Thirdly, for combination with a diversity protection strategy for the population, we design an elitism retention based selection method to boost the convergence speed and avoid being trapped by a local optimum. Finally, we present an ordered identification method oriented toward reliability-critical gates using a scoring mechanism to retain the potential optimal solutions in each round to improve the robustness of the proposed locating method. The simulation results on benchmark circuits show that the proposed method PGA is an efficient locating method for reliability-critical gates in terms of accuracy and convergence speed.
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    • References (30)
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    3. Jie Xiao, Wenbo Chen, Jungang Lou, et al. Identifying Reliability-Critical Primary Inputs of Combinational Circuits Based on the Model of Gate-Sensitive Attributes. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022, 41(11): 4708. DOI:10.1109/TCAD.2022.3142194
    4. Jie Xiao, Qiou Ji, Qing Shen, et al. Accelerating stochastic‐based reliability estimation for combinational circuits at RTL using GPU parallel computing. International Journal of Intelligent Systems, 2022, 37(11): 8309. DOI:10.1002/int.22940
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    6. Jie Xiao, Zhanhui Shi, Xuhua Yang, et al. BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical Gates in Combinational Logic Blocks. IEEE Transactions on Computers, 2022, 71(5): 1063. DOI:10.1109/TC.2021.3071253
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