We use cookies to improve your experience with our site.
Dan Hao, Lu Zhang, Ming-Hao Liu, He Li, Jia-Su Sun. Test-Data Generation Guided by Static Defect Detection[J]. Journal of Computer Science and Technology, 2009, 24(2): 284-293.
Citation: Dan Hao, Lu Zhang, Ming-Hao Liu, He Li, Jia-Su Sun. Test-Data Generation Guided by Static Defect Detection[J]. Journal of Computer Science and Technology, 2009, 24(2): 284-293.

Test-Data Generation Guided by Static Defect Detection

  • Software testing is an important technique to assure the quality of software systems, especially high-confidence systems. To automate the process of software testing, many automatic test-data generation techniques have been proposed. To generate effective test data, we propose a test-data generation technique guided by static defect detection in this paper. Using static defect detection analysis, our approach first identifies a set of suspicious statements which are likely to contain faults, then generates test data to cover these suspicious statements by converting the problem of test-data generation to the constraint satisfaction problem. We performed a case study to validate the effectiveness of our approach, and made a simple comparison with another test-data generation on-line tool, JUnit Factory. The results show that, compared with JUnit Factory, our approach generates fewer test data that are competitive on fault detection.
  • loading

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return