Test Derivation Through Critical Path Transitions

In this paper,a new technique called test derivation is presented,aiming at the promotion of the random testing efficiency for combinational circuits.Combined with a fault simulator based on critical path tracing method,we introduce the concept of seed test derivation and attempt to generate a group of new tests from the seed test by means of critical path transition.The necessary conditions and effi- cient algorithms are proposed to guarantee the usefulness of the newly derived tests and the correctness of…