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Li Zhongcheng, Min Yinghua. Pseudo-Random Test Generation for Large Combinational Circuits[J]. Journal of Computer Science and Technology, 1992, 7(1): 19-28.
Citation: Li Zhongcheng, Min Yinghua. Pseudo-Random Test Generation for Large Combinational Circuits[J]. Journal of Computer Science and Technology, 1992, 7(1): 19-28.

Pseudo-Random Test Generation for Large Combinational Circuits

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  • Published Date: January 09, 1992
  • In this paper,a simulation system of pseudo-random testing is described first to investigate the characteristics of pseudo-random testing.Several interesting experimental results are obtained.It is found out that initial states of pseudo-random sequences have little effect on fault coverage.Fixed connection between LFSR outputs and circuit inputs in which the number of LFSR stages m is less than the number of circuit inputs n leads to low fault coverage,and the fault coverage is reduced as m decreases.The l…
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