ICTSSE: An Object-Oriented IC Test Software Supporting Environment
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Abstract
An IC test software supporting environment-ICTSSE, which supports the migration and simulation of test 'pattern programs on heterogeneous ATEs, is presented. ICTSSE is a subsystem of Test Developmellt System (TeDS). It has the capabilities of verifying the IC's stimulus/response vectors and associated timing resources against the target ATE. The general data interchange format,which is the center of the TeDS, is built for test pattern migration.
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