Functional-Level Fault Simulation with Concurrent and Parallel Mechanisms Using Object-Oriented VLSI Model

The functional-level test has been proposed as an alternative to reduce the complexity of test when VLSI gets larger and more complicated. It has been successful for circuits such as memories, PLAs and microprocessors. However, the functional-level test for general functional models has seldom been studied. This paper presents an object-oriented VLSI model and a functional-level fault simulation methodology for general functional model. Based on the proposed VLSI model, FFS (Functional-level Fault Simulator…