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BI Jun, WU Jianping. An Approach to Concurrent TTCN Test Generation[J]. Journal of Computer Science and Technology, 1999, 14(6): 614-618.
Citation: BI Jun, WU Jianping. An Approach to Concurrent TTCN Test Generation[J]. Journal of Computer Science and Technology, 1999, 14(6): 614-618.

An Approach to Concurrent TTCN Test Generation

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  • Published Date: November 09, 1999
  • The basis of distributed system conformance testing is to test theconformance of each entity with its standard. This paper addresses the approach toentity conformance testing based on concurrent TTCN. First a preliminary framework for entity conformance testing is introduced and a specification model CEBEis presented. Then a test generation method, which could directly derive concurrentTTCN test suite from CEBE, is proposed.
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