Testability Analysis at Switch Level for CMOS Circuits

Shen Li. Testability Analysis at Switch Level for CMOS Circuits[J]. Journal of Computer Science and Technology, 1990, 5(2): 197-202.

Citation:

Shen Li. Testability Analysis at Switch Level for CMOS Circuits[J]. Journal of Computer Science and Technology, 1990, 5(2): 197-202.

Citation:

Shen Li. Testability Analysis at Switch Level for CMOS Circuits[J]. Journal of Computer Science and Technology, 1990, 5(2): 197-202.

Abstract

In this paper we propose a controllability and observability measure at switch level for CMOS circuits based on the cost analysis approach.The complexity of the algorithm is nearly linear.

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