摘要: Because of high development costs of IC (Integrated Circuit) test programs,recycling ekisting test programs from one kind of ATE (Automatic Test Equip-ment) to another or generating directly from CAD simulation modules to ATEis more and more vauable. In this papert a new approach to migrating test pro-grams is presented. A virtual ATE model based on object-oriellted paradigm isdeveloped; it runs Test C++ (an intermediate test control language) programsand TeIF (Test Intermediate Format - an intermediate pat…