We use cookies to improve your experience with our site.
Sun Yuning, Wang Xiaoming, Shi Wanchun. ICTSSE: An Object-Oriented IC Test Software Supporting Environment. Journal of Computer Science and Technology, 1995, 10(5): 447-454.
Citation: Sun Yuning, Wang Xiaoming, Shi Wanchun. ICTSSE: An Object-Oriented IC Test Software Supporting Environment. Journal of Computer Science and Technology, 1995, 10(5): 447-454.

ICTSSE: An Object-Oriented IC Test Software Supporting Environment

  • An IC test software supporting environment-ICTSSE, which supports the migration and simulation of test 'pattern programs on heterogeneous ATEs, is presented. ICTSSE is a subsystem of Test Developmellt System (TeDS). It has the capabilities of verifying the IC's stimulus/response vectors and associated timing resources against the target ATE. The general data interchange format,which is the center of the TeDS, is built for test pattern migration.
  • loading

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return