A Mixed-Mode BIST Scheme Based on Folding Compression

In this paper a new scheme for mixedmode scan-based BIST is presented with complete fault coverage, and somenew concepts of folding set and computing are introduced. This schemeapplies single feedback polynomial of LFSR for generating pseudo-randompatterns, as well as for compressing and extending seeds of folding sets and anLFSR, where we encode seed of folding set as an initial seed of LFSR.Moreover these new techniques are 100% compatible with scan design.Experimental results show that the proposed scheme outperformspreviously published approaches based on the reseeding of LFSRs.