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Volume 5 Issue 2
April  1990
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Li Jintao, Min Yinghua. Product-Oriented Test-Pattern Generation for Programmable Logic Arrays[J]. Journal of Computer Science and Technology, 1990, 5(2): 164-174.
Citation: Li Jintao, Min Yinghua. Product-Oriented Test-Pattern Generation for Programmable Logic Arrays[J]. Journal of Computer Science and Technology, 1990, 5(2): 164-174.
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Product-Oriented Test-Pattern Generation for Programmable Logic Arrays

  • CAD Laboratory Institute of Computing Technology; Academia Sinica; CAD Laboratory; Institute of Computing Technology;

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  • Published Date: April 09, 1990
    Abstract
  • A Product-oriented test-pattern generation strategy for Programmable Logic Arrays(PLAs)is pres- ented.First the personality of products is discussed.Products are divided into several categories to speed up the test generation.This strategy aims at generating a very compact test set for crosspoint defects through the fol- lowing steps:1)generate special test vectors for each category of products at the beginning of test generation. Each vector is capable of detecting a great amount of crosspoint defects;2)ge…
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    • References (5)
  • [1]
    H.Fleisher and L.I.Maissel. An introduction to array logic, IBM J. Res. Develop., l9 (1975). 98-109.
    [2]
    Signetics Field Programmable Logic Array, Sunnyvale. CA: Signetics. Mar. 1976.
    [3]
    C.W.Cha, A testing strategy for PLAs, Proc. l5th Design Auto. Conf., 1978, 83-89.
    [4]
    E.J.Muelhdorf and T.W.Williams. Optimized stuck-fault test pattern generation for PLA macro. Dig. IEEE semiconductor test symp., Cherry Hill. Oct.1977, 88-101.
    [5]
    D.L.Ostapko and S.J.Hong, Fault analysis and test pattern generation for programmable logic arrays, IEEE Trans.on Compur.,C-28(1979). 617-626. ……….
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