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Volume 9 Issue 2
April  1994
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Xiang Dong, Wei Daozheng. GLOBAL: A Design for Random Testability Algorithm[J]. Journal of Computer Science and Technology, 1994, 9(2): 182-192.
Citation: Xiang Dong, Wei Daozheng. GLOBAL: A Design for Random Testability Algorithm[J]. Journal of Computer Science and Technology, 1994, 9(2): 182-192.
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GLOBAL: A Design for Random Testability Algorithm

  • CAD Lab.; Institute of Computing Technology; Chinese Academy Of Sciences; Beijing 100080;

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  • Published Date: April 09, 1994
    Abstract
  • A global design for testability algorithm is offered in this paper. First, a test point candidate set is obtained to simplify the test point placemellt problem; the principle of selective tracing is offered to get a sequential test point placement solution, which is used as the initial solution of the global algorithm. Using this initial value, a branch & bound algorithm is then offered to obtain a global design for testability solution. Finally,a new test length analyser is offered to evaluate the global d…
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    • References (3)
  • [1]
    Chen.T.H, Breuer.M.A. Automatic design for testability via testability measures. IEEE Trans.CAD, 1985, CAD-4: 3-11.
    [2]
    Krishnamurthy.B. A dynamic programming approach to the test point insertion problem. In:24th ACM/IEEE DAC, 695-705, 1986.
    [3]
    Xiang Dong. A knowledge based design for testability. Acts Electronics Sinica., 1991, 19(3):lO6-109. ……….
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